Wire bonders and methods of wire-bonding

ABSTRACT

Wire bonders and methods of wire-bonding are disclosed herein. In one embodiment, a method includes attaching a wire to a terminal of a microelectronic component and generating an arc between a first electrode and a second electrode to sever the wire at a point at least proximate to the first and second electrodes. In another embodiment, a wire bonder includes a bond head having a capillary, a first electrode and a second electrode each disposed relative to the bond head, and a controller operably coupled to the first and second electrodes. The controller has a computer-readable medium containing instructions to perform the above-mentioned method.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No. 10/635,947 filed Aug. 6, 2003, now U.S. Pat. No. 7,227,095 issued Jun. 5, 2007, which is incorporated herein by reference in its entirety.

TECHNICAL FIELD

The present invention relates to wire bonders and methods for wire-bonding microelectronic components. In particular, aspects of the invention relate to wire bonders having a plurality of electrodes and methods for wire-bonding microelectronic components utilizing the plurality of electrodes to sever the wire.

BACKGROUND

Microelectronic devices are used in cell phones, pagers, personal digital assistants, computers, and many other products. A packaged microelectronic device can include a microelectronic die, an interposer substrate or lead frame attached to the die, and a molded casing around the die. One process for packaging microelectronic devices at the die level includes (a) attaching individual dies to an interposer substrate, (b) wire-bonding contacts on the dies to corresponding components on the interposer substrate, and (c) encapsulating the dies with a molding compound.

FIG. 1 is a top cutaway isometric view of an existing microelectronic device 10. The microelectronic device 10 includes a substrate 6 and a microelectronic die 4 attached to the substrate 6. The microelectronic device 10 shown in FIG. 1 illustrates the substrate 6 and the die 4 before encapsulating the die 4 with an encapsulation compound. The substrate 6 includes a first array of ball-pads 2, a second array of terminal pads 3 proximate to a slot 18, and a trace 22 or other type of conductive line between each ball-pad 2 and corresponding terminal pad 3. The slot 18 extends lengthwise along a medial portion of the substrate 6. The substrate 6 is an interposing device that provides an array of ball-pads for coupling very small contacts on the microelectronic die to another type of device.

The microelectronic die 4 can include a plurality of small contacts 5 and an integrated circuit 7 (shown schematically) coupled to the contacts 5. The contacts are arranged in an array on the microelectronic die 4 so that the contacts 5 are aligned with or otherwise accessible through the slot 18 in the substrate 6. A plurality of wire-bonds 9 electrically couple the contacts 5 of the die 4 to corresponding terminal pads 3 on the substrate 6. A wire bonder forms the wire-bonds 9 between the die 4 and the substrate 6 with a capillary, which feeds wire through a central aperture. For example, a molten ball formed at a protruding end of the wire and the capillary are pressed against one of the contacts 5 to attach the end of the wire to the die 4. The capillary then moves upward and laterally to attach the wire to the terminal pad 3 on the substrate 6.

In other applications, the capillary may attach only one end of the wire-bond. For example, a microelectronic device can include a die and a wire-bond having a first end attached to the die and a second, free end projecting away from the die. In these applications, the wire bonder attaches the end of the wire to the die and then severs the wire. The wire is typically severed by placing an electrical potential on the wire and an opposite potential on a single electrode adjacent to the wire to generate a spark between the electrode and the wire. The single electrode is positioned at a desired point to sever the wire so that the spark cuts the wire and forms a ball at the end of the wire. As set forth in U.S. Pat. No. 5,773,780, the wire bonders can also include a light source that directs light toward a segment of the wire to stabilize the spark. These approaches, however, have several drawbacks. For example, the point at which the wire is severed is not consistent and predictable because the spark can occur between the electrode and anywhere along a segment of the wire proximate to the electrode. Thus, the length of the wire-bond may be shorter or longer than desired. Moreover, it is difficult and expensive to retrofit existing wiring bonding machines with the light source. Accordingly, there exists a need to improve the process of severing the wire during wire-bonding.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a top cutaway isometric view of an existing microelectronic device.

FIGS. 2-6 illustrate various stages in a method of wire-bonding microelectronic components in accordance with one embodiment of the invention.

FIG. 2 is a schematic side cross-sectional view of a wire bonder for attaching a wire to a microelectronic component.

FIG. 3 is a schematic side cross-sectional view of the wire bonder after the capillary has attached the first end of the wire to the microelectronic component.

FIG. 4 is a schematic side cross-sectional view of the microelectronic component and the wire bonder after moving the capillary toward the bond head.

FIG. 5 is a schematic side cross-sectional view of the microelectronic component and the wire bonder after severing the wire.

FIG. 6 is a schematic side cross-sectional view of the microelectronic component, the wire segment, and a second microelectronic component.

FIG. 7 is a schematic side cross-sectional view of the wire bonder and a wire segment attached to a microelectronic component in accordance with another embodiment of the invention.

FIG. 8 is a schematic top cross-sectional view of a portion of a wire severing tool in accordance with another embodiment of the invention.

DETAILED DESCRIPTION A. Overview

The following disclosure describes several embodiments of wire bonders having a plurality of electrodes and methods of wire-bonding microelectronic components utilizing the plurality of electrodes. Many specific details of the present invention are described below with reference to microelectronic components. The term “microelectronic component,” however, is used throughout to include microelectronic devices, micromechanical devices, data storage elements, read/write components, and other articles of manufacture. For example, microelectronic components include SIMM, DRAM, Flash-Memory, ASICS, processors, flip chips, ball grid array (BGA) chips, and other types of microelectronic devices or components. The term “terminal” is used throughout to include bond-pads, ball-pads, contacts, leads, and other electrical connection points. Many specific details of several embodiments of the invention are described below with reference to microelectronic devices including microelectronic dies in order to provide a thorough understanding of such embodiments. A person of ordinary skill in the art will understand, however, that the invention may have other embodiments with additional elements or without several of the features shown and described below with reference to the embodiments of FIGS. 2-8.

One aspect of the invention is directed to methods of wire-bonding. In one embodiment, a method includes attaching a wire to a terminal of a microelectronic component and generating an arc between a first electrode spaced apart from the wire and a second electrode spaced apart from the wire to sever the wire at a point at least proximate to the first and second electrodes. The arc between the first and second electrodes can form a first segment of wire having a first end attached to the terminal and a second, free end. In one aspect of this embodiment, the method further includes positioning the first and second electrodes proximate to the wire before generating the arc. The first and second electrodes can be movable relative to a bond head, or the electrodes can be movable as a unit with the bond head. In another aspect of this embodiment, the first and second electrodes include tips that are positioned on opposite sides of the wire before generating the arc. The first and second electrodes can also include end portions that are oriented at an angle generally normal to the wire.

In another embodiment, a method includes positioning a wire in an opening of a wire severing tool. The wire severing tool includes a first electrode and a second electrode spaced apart from each other and the wire to define the opening. The method further includes generating an electrical discharge between the first and second electrodes of the wire severing tool to sever the wire. The wire severing tool can also include a dielectric member separating the first and second electrodes.

Another aspect of the invention is directed to wire bonders for bonding a wire to a terminal of a microelectronic component. In one embodiment, a wire bonder includes a bond head having a capillary, first and second electrodes each disposed relative to the bond head, and a controller operably coupled to the first and second electrodes. The controller has a computer-readable medium containing instructions to perform at least one of the above-mentioned methods.

B. Method of Wire-Bonding Microelectronic Components

FIGS. 2-6 illustrate various stages in a method of wire-bonding microelectronic components in accordance with one embodiment of the invention. FIG. 2, more specifically, is a schematic side cross-sectional view of a wire bonder 100 for attaching a wire 140 to a microelectronic component 110. The microelectronic component 110 in the illustrated embodiment is a microelectronic die; however, in other embodiments, the microelectronic component can be an interposer substrate, a lead frame, or other type of component. The microelectronic component 110 includes an active side 112, a back side 114 opposite the active side 112, a terminal 120 in the active side 112, and an integrated circuit 116 (shown schematically) electrically coupled to the terminal 120.

The wire bonder 100 of the illustrated embodiment includes a bond head 130 (partially shown in broken lines) and a wire supply 150 (shown schematically) to provide the wire 140 to the bond head 130. The wire supply 150 can include a spool of the wire 140, and the wire 140 can have a first end 142 with a ball 144. The bond head 130 includes a capillary 132 having an aperture 136 to receive the wire 140 and an actuator 139 (shown schematically) coupled to the capillary 132. The actuator 139 selectively moves the capillary 132 downward to bond the first end 142 of the wire 140 to the terminal 120 of the microelectronic component 110, as described in greater detail below with reference to FIG. 5. The capillary 132 includes a tip 138 at which the aperture 136 can have a larger diameter to at least partially receive the ball 144 of the wire 140.

The wire bonder 100 further includes a first electrode 160 a coupled to the bond head 130, a second electrode 160 b coupled to the bond head 130, a power supply 163, and a controller 180 (shown schematically) operably coupled to power supply 163 to operate the first and second electrodes 160 a-b. The controller 180, more specifically, can include a computer-readable medium to instruct the power supply 163 to place electrical potentials on the first and second electrodes 160 a-b, which generate an electrical discharge or arc between the electrodes 160 to sever the wire 140. The first electrode 160 a can include a first end 162 a with a sharp tip, and the second electrode 160 b can include a first end 162 b with a sharp tip. The first and second electrodes 160 a-b are arranged so that the electrical discharge occurs between the first ends 162 a-b, and the sharp tips provide precise control of the path of the discharge and thus the point at which the wire 140 is severed. In one embodiment, the first electrode 160 a can be an anode, the second electrode can be a cathode, and the wire 140 can be grounded. In other embodiments, the electrodes 160 may be charged differently, and the wire 140 may not be grounded and/or may have a charge.

In the illustrated embodiment, the wire bonder 100 includes a positioning mechanism 170 (shown schematically in broken lines) coupled to the bond head 130 to move the first and second electrodes 160 a-b relative to the bond head 130. The positioning mechanism 170 can move the first and second electrodes 160 a-b in applications in which the electrodes 160 a-b would otherwise interfere with the movement of the capillary 132. Moreover, the positioning mechanism 170 can move the first and second electrodes 160 a-b to the proper position proximate to the wire 140 before the electrical discharge occurs. The positioning mechanism 170 can include mechanical and/or electrical components. For example, in one embodiment, the positioning mechanism 170 can include a servo-driven translating mechanism with linear bearings. In other embodiments, the positioning mechanism 170 can have other configurations. In additional embodiments, one or both of the electrodes 160 may not be movable relative to the bond head 130. In such an embodiment, the wire bonder may not include a positioning mechanism.

FIG. 3 is a schematic side cross-sectional view of the wire bonder 100 after the capillary 132 has attached the first end 142 of the wire 140 to the microelectronic component 110. Before the capillary 132 moves the first end 142 of the wire 140 toward the microelectronic component 110, a wire tensioner (not shown) can pull the wire 140 back toward the wire supply 150 to position the ball 144 (FIG. 2) at least partially within the aperture 136 (FIG. 2) at the tip 138 of the capillary 132. If the ball 144 is not positioned at least partially within the aperture 136, the capillary 132 may not attach the first end 142 of the wire 140 at the center of the terminal 120. Once the microelectronic component 110 is properly aligned with the bond head 130, the actuator 139 moves the capillary 132 in a direction D₁ toward the microelectronic component 110 to press the first end 142 of the wire 140 against the component 110. The capillary 132 can apply heat, ultrasonic energy, and/or pressure to the wire 140 to bond the first end 142 to the terminal 120.

FIG. 4 is a schematic side cross-sectional view of the wire bonder 100 after the capillary 132 has moved toward the bond head 130. The actuator 139 moves the capillary 132 in a direction D₂ after the first end 142 of the wire 140 is bonded to the terminal 120 of the microelectronic component 110. As the capillary 132 moves in the direction D₂, the wire 140 feeds through the aperture 136. Next, the positioning mechanism 170 can move the first and second electrodes 160 a-b to the discharge position. More specifically, in one embodiment the first ends 162 a-b of the first and second electrodes 160 a-b are adjacent to opposite sides of the wire 140 and oriented at an angle generally perpendicular to the wire 140. The first ends 162 a-b can be spaced apart by a gap G sized to receive the wire 140 and permit arcing between the electrodes 160. The first and second electrodes 160 a-b are positioned so that the desired point of severance on the wire 140 is between the first ends 162 a-b.

FIG. 5 is a schematic side cross-sectional view of the wire bonder 100 after the wire 140 has been severed. After the first and second electrodes 160 a-b are properly positioned on opposite sides of the wire 140, the controller 180 instructs the power supply 163 to energize the first and second electrodes 160 a-b. This generates an electrical discharge between the electrodes 160 and across the wire 140, which severs the wire 140 at the desired point between the electrodes 160. The electrical discharge accordingly forms a wire segment 241 having a first end 142 attached to the terminal 120 of the microelectronic component 110 and a second, free end 246 opposite the first end 142. The electrical discharge also forms a new first end 242 on the wire 140. In one embodiment, the electrical discharge can create a ball 248 at the second end 246 of the wire segment 241 and a ball 244 at the first end 242 of the wire 140. In other embodiments, the wire bonder 100 can provide additional electrical discharges to create the balls 244 and 248. After the ball 244 at the first end 242 of the wire 140 is formed, the wire bonder 100 can attach the first end 242 of the wire 140 to another terminal of a microelectronic component.

One feature of the wire bonder in the embodiment illustrated in FIGS. 2-5 is that the wire bonder severs a wire at a predictable and consistent point because the electrical discharge occurs directly between the tips at the ends of the electrodes. One advantage of this feature is that the wire can be severed at a desired point to form a wire segment having a desired length. This is an improvement over wire bonders that use a single electrode because the electrical discharge from a single electrode may not take a direct path to the wire. Another advantage of the wire bonder is its relatively simple configuration. This is an improvement over prior art wire bonders having a single electrode and a light source because the light source must be illuminated at a precise moment and can be difficult to retrofit on existing machines.

FIG. 6 is a schematic side cross-sectional view of the wire segment 241 attached to a second microelectronic component 310. After the wire 140 (FIG. 5) has been severed to form the wire segment 241, the wire segment 241 can be plated to increase its rigidity. Next, the second end 246 of the wire segment 241 can be attached to a terminal 320 of the second microelectronic component 310 by thermosonic coupling, vibration welding, heat welding, or another suitable process. The ball 248 at the second end 246 can be heated to a temperature sufficient to bond the second end 246 to the terminal 320. The second microelectronic component 310 can be a die with an integrated circuit electrically coupled to the terminal 320 or an interposer substrate with a plurality of leads or ball grid arrays. The wire segment 241 can accordingly couple the integrated circuit 116 on the microelectronic component 110 to an integrated circuit, lead, and/or ball in a ball grid array on the second microelectronic component 310.

C. Other Methods of Wire-Bonding Microelectronic Components

FIG. 7 is a schematic side cross-sectional view of the wire bonder 100 and a wire segment 441 attached to a microelectronic component 410 in accordance with another embodiment of the invention. The microelectronic component 410 includes the first terminal 420 a, a second terminal 420 b, and an integrated circuit 416 (shown schematically) electrically coupled to the first and second terminals 420 a-b. Before a wire 440 is severed and the wire segment 441 is formed, the wire bonder 100 attaches a first end 443 of the wire 440 to the first terminal 420 a of the microelectronic component 410. Next, the capillary 132 moves laterally to form a loop 445 in the wire 440 and attaches a portion 447 of the wire 440 to the second terminal 420 b of the microelectronic component 410. The capillary 132 then feeds out the wire 440 as it moves away from the microelectronic component 410. Next, the electrodes 160 a-b are properly positioned and sever the wire, as described above with reference to FIG. 5, to form the wire segment 441. In other embodiments, the wire bonder 100 can form wire segments with other configurations.

D. Other Configurations of Electrodes

FIG. 8 is a schematic top cross-sectional view of a portion of a wire severing tool 500 in accordance with one embodiment of the invention. The wire severing tool 500 can be used with a wire bonder, similar to the wire bonder 100 described above with reference to FIG. 7, to sever the wire 140 at a desired point. The wire severing tool 500 includes a first electrode 560 a, a second electrode 560 b, and a dielectric member 590 between the first and second electrodes 560 a-b. The first electrode 560 a includes an attachment portion 566 a for attachment to the wire bonder and a distal portion 562 a having a tip 564 a. Similarly, the second electrode 560 b includes an attachment portion 566 b and a distal portion 562 b having a tip 564 b. The attachment portions 566 a-b of the severing tool 500 can be operably coupled to a positioning mechanism to move the tool 500 relative to the bond head of the wire bonder. Alternatively, the severing tool 500 may not be movable relative to the bond head.

The distal portions 562 a-b of the first and second electrodes 560 a-b define an opening 598 in the severing tool 500 to receive the wire 140. The distal portions 562 a-b can have an arcuate configuration as shown in FIG. 8. In other embodiments, the distal portions 562 a-b can have angled sections to align the tips 562 a-b across a discharge gap. The tips 564 a-b are spaced apart by a distance G₂ sized to receive the wire 140 with a small space between the wire 140 and the tips 564 a-b. To sever the wire 140, the electrodes 560 a-b are energized to generate an electrical discharge between the tips 564 a-b. The dielectric member 590 is configured to electrically insulate the first and second electrodes 560 a-b so that the electrical discharge occurs between the tips 564 a-b. In other embodiments, the wire severing tool can have other configurations.

From the foregoing, it will be appreciated that specific embodiments of the invention have been described herein for purposes of illustration, but that various modifications may be made without deviating from the spirit and scope of the invention. Accordingly, the invention is not limited except as by the appended claims. 

1. A method of wire-bonding, comprising: attaching a wire to a terminal of a microelectronic component, attaching the wire includes moving a capillary between a first position spaced from the terminal and a second position at least proximate to the terminal; moving a first electrode and a second electrode between a first arrangement at least proximate to a point along the wire and a second arrangement configured not to interfere with moving the capillary between the first and second positions; and generating an arc between the first and second electrodes in the first arrangement to sever the wire at the point.
 2. The method of claim 1 wherein moving the first and second electrodes comprises moving the first and second electrodes relative to a bond head.
 3. The method of claim 1 wherein moving the first and second electrodes comprises moving the first and second electrodes and a bond head as a unit to the first arrangement before generating the arc.
 4. The method of claim 1 wherein: the first electrode comprises a first tip and the second electrode comprises a second tip; and the method further comprises positioning the first and second tips on opposite sides of the wire in the first arrangement before generating the arc.
 5. The method of claim 1 wherein: the first electrode comprises a first end portion and the second electrode comprises a second end portion; and the method further comprises positioning the first and second end portions at an angle generally normal to the wire in the first arrangement before generating the arc.
 6. The method of claim 1 wherein: the first electrode comprises an anode and the second electrode comprises a cathode; and generating the arc comprises generating the arc between the anode and the cathode.
 7. A method of wire-bonding, comprising: attaching a wire to a first terminal of a first microelectronic component; moving first and second electrodes with respect to the wire attached to the first terminal; and generating an arc between the first electrode and the second electrode to sever the wire and to form a segment of wire having a first end attached to the first terminal and a second, free end; and plating the segment of wire.
 8. The method of claim 7 wherein generating the arc between the first and second electrodes comprises forming a ball at the second, free end of the segment of wire.
 9. The method of claim 8 further comprising attaching the ball at the second, free end of the segment of wire to a terminal of a second microelectronic component.
 10. The method of claim 7 wherein attaching the wire to the terminal comprises moving a capillary between a first position spaced from the terminal and a second position at least proximate to the terminal.
 11. The method of claim 7 wherein generating the arc between the first and second electrodes comprises forming a ball at a free end of the wire.
 12. The method of claim 11, further comprising: tensioning the wire by drawing the ball at the free end of the wire toward a capillary, wherein the capillary includes an aperture to receive the wire; and attaching the ball at the free end of the wire to a second terminal of the first microelectronic component.
 13. The method of claim 7, further comprising controlling attaching the wire to the first terminal and generating the arc between the first and second electrodes with a non-transitory computer-readable medium.
 14. The method of claim 7 wherein plating the segment of wire increases rigidity of the segment of wire.
 15. A method of wire-bonding a first terminal of a first microelectronic component to a second terminal of a second microelectronic component, comprising: moving a capillary between a first position spaced from the first terminal and a second position at least proximate to the first terminal, wherein the capillary carries a wire; attaching the wire to the first terminal of the first microelectronic component when the capillary is in the second position; moving a first electrode and a second electrode between a first arrangement spaced from the wire when the capillary is in the second position and a second arrangement at least proximate to a point along the wire when the capillary is in the first position; severing the wire at the point when the first and second electrodes are in the second arrangement to form a segment of wire, wherein the segment of wire extends between the first terminal and a first free end formed by severing the wire at the point; moving the first and second electrodes to the first arrangement after severing the wire; and attaching the first free end of the segment of wire to the second terminal of the second microelectronic component.
 16. The method of claim 15 wherein moving the first and second electrodes between the first and second arrangements does not interfere with moving the capillary between the first and second positions.
 17. The method of claim 15, further comprising plating the segment of wire.
 18. The method of claim 15 wherein severing the wire at the point comprises generating an arc between the first and second electrodes in the first arrangement.
 19. The method of claim 15, further comprising: forming a ball on the wire at a second free end formed by severing the wire at the point; tensioning the wire by drawing the ball toward the capillary; and attaching the ball to another terminal of the first microelectronic component. 